Introduction
I have collected a number of links into various patent databases for easy access.
This is part of my EM pages.
Unsorted patents
- 3,535,516 Electron microscope employing a modulated scanning beam and a phase sensitive detector to improve the signal to noise ratio.
- 4,308,457 Device for the detection of back-scattered electrons from a sample in an electron microscope.
- 4,596,928 Method and apparatus for an atmospheric scanning electron microscope.
- 4,720,633 Scanning electron microscope for visualization of wet samples.
- 4,785,182 Secondary electron detector for use in a gaseous atmosphere.
- 4,823,006 Integrated electron optical/differential pumping/imaging signal detection system for an environmental scanning electron microscope.
- 4,857,743 Disposable spray aperture.
- 4,880,976 Secondary electron detector for use in a gaseous atmosphere.
- 4,897,545 Electron detector for use in a gaseous environment.
- 4,992,662 Multipurpose gaseous detector device for electron microscope.
- 5,250,808 Integrated electron optical/differential pumping/imaging signal system for an environmental scanning electron microscope.
- 5,362,964 Environmental scanning electron microscope.
- 5,412,211 Environmental scanning electron microscope.
- 2,928,943 Electronic microscope for top illumination of surfaces.
- 5,200,616 Environment controllable scanning probe microscope.
- 4,537,477 Scanning electron microscope with an optical microscope.
- 4,990,776 Electron microscope.
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Patents related to detectors.
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